Optimization of the Adhesion Strength of Arc Ion Plating TiAlN Films by the Taguchi Method

A three-level six-factor (arc power, substrate temperature, pre-treatment bias voltage, working pressure, deposition bias voltage and pretreatment time) orthogonal experimental array (L18) to optimize the adhesion strength of arc ion plating (AIP) TiAlN films was designed using the Taguchi method. An optimized film process, namely substrate temperature 220 °C, arc power 60 A, negative bias voltage -800 V, nitrogen pressure 10 Torr, pretreated voltage -450 V and pretreated time 15 minutes was obtained by the Taguchi program for the purpose of obtaining a larger critical load. The critical load of the optimized TiAlN film (53 N) was increased by 43% compared to the film with the highest critical load before optimization. The improvement in the adhesion strength of the films was attributed to the enhancement of hardness and the competitive growth of the (111), (200) and (220) orientations in the film.